NOOR LAFTA. HAMDAN; FARIS S. ATALLAH; MOHAMMED K. KHALAF; IBRAHIM K. SALMAN. Investigate the Structural and Optical Properties of RF-Sputtered V2O5 thin films deposited at different Power. Tikrit Journal of Pure Science, [S. l.], v. 25, n. 1, p. 102–107, 2020. DOI: 10.25130/tjps.v25i1.219. Disponível em: https://tjps.tu.edu.iq/index.php/tjps/article/view/219. Acesso em: 18 may. 2024.