AMJAD HUSSEN JASSEM; HANAA E. JASSEM; SHIHAB AHMAED KALAF; NAJAT A. DAHHAM. Effect of wafer resistivity and light intensity on the topography of porous silicon surfaces produced by photo chemical method. Tikrit Journal of Pure Science, [S. l.], v. 23, n. 6, p. 131–139, 2023. DOI: 10.25130/tjps.v23i6.682. Disponível em: https://tjps.tu.edu.iq/index.php/tjps/article/view/682. Acesso em: 3 jul. 2024.