Preparation CdSe thin films by vacuum thermal evaporation and studying the effect of annealing time on structural, electrical and optical properties.

Authors

  • Kawkab D. Salim
  • Hanan Ridha

DOI:

https://doi.org/10.25130/tjps.v26i2.123

Abstract

CdSe thin films were deposited on a glass substrate by using vacuum thermal evaporation technique. The deposited films were annealed to 350˚C for (10, 20, 30) minutes respectively. Structural, morphological, optical and electrical properties of the films were studied by using X-ray diffraction (XRD), ultraviolet-visible (UV-Vis) spectroscopy; and Atomic force microscope (AFM). The X-ray diffraction pattern showed that the film has a cubic phase with preferred orientation (111), the grain size was found to be in the range of( 31-46)nm. The UV tests explain that the energy bandgap decrease with increasing of annealing time from 2.43eV to 2.17eV after 20minute annealed.

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Published

2022-12-03

How to Cite

Kawkab D. Salim, & Hanan Ridha. (2022). Preparation CdSe thin films by vacuum thermal evaporation and studying the effect of annealing time on structural, electrical and optical properties. Tikrit Journal of Pure Science, 26(2), 88–93. https://doi.org/10.25130/tjps.v26i2.123

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Articles