Study The effect of Annealing and Argon Laser Irradiation on the optical properties of SnO2 Thin film

Authors

  • N . F . Abdul-Jabbar
  • Z . N . Majeed
  • M . A . Kamil
  • A.M.Ali

DOI:

https://doi.org/10.25130/tjps.v20i1.1144

Abstract

In this research we study  the effect of Argon  Laser  Irradiation and annealing on the  some optical properties of SnO2 Thin film . These films were prepared by chemical spray pyrolysis  method. The film thickness was 1500 A°. optical properties such as (Reflection, Energy band gab, Absorption coefficient, Refractive index, and extinction coefficient) as a function of photon energy have been studied within the wavelength range (300-900) nm, using (u v-visible) Spectrophotometer, before  and after irradiation and annealing. it is found that the  optical properties were change .

Downloads

Published

2023-02-08

How to Cite

N . F . Abdul-Jabbar, Z . N . Majeed, M . A . Kamil, & A.M.Ali. (2023). Study The effect of Annealing and Argon Laser Irradiation on the optical properties of SnO2 Thin film. Tikrit Journal of Pure Science, 20(1), 121–125. https://doi.org/10.25130/tjps.v20i1.1144

Issue

Vol. 20 No. 1 (2015)

Section

Articles

License

Copyright (c) 2023 Tikrit Journal of Pure Science

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

Tikrit Journal of Pure Science is licensed under the Creative Commons Attribution 4.0 International License, which allows users to copy, create extracts, abstracts, and new works from the article, alter and revise the article, and make commercial use of the article (including reuse and/or resale of the article by commercial entities), provided the user gives appropriate credit (with a link to the formal publication through the relevant DOI), provides a link to the license, indicates if changes were made, and the licensor is not represented as endorsing the use made of the work. The authors hold the copyright for their published work on the Tikrit J. Pure Sci. website, while Tikrit J. Pure Sci. is responsible for appreciate citation of their work, which is released under CC-BY-4.0, enabling the unrestricted use, distribution, and reproduction of an article in any medium, provided that the original work is properly cited.