Study the structural and Optical properties of ZnO thin film
DOI:
https://doi.org/10.25130/tjps.v22i1.619Abstract
This research included preparation of ZnO thin films from Zinc acetate solution (Zn(CH3COO)22H2O). on glass substrate with dimension (2.5cmx2.5cmx0.1cm) using chemical spray pyrolysis method composed with (0.2M). The structural properties were characterized by X-Ray diffraction (XRD), Atomic force microscope (AFM), Scanning electron microscope (SEM) and Energy dispersive of X-Ray (EDX). The film grown have a polycrystalline wurtizte structure it can be seen that the highest texture coefficient was in (002) plane. So (AFM) measurement show that the roughness average (1.51nm), root mean square (RMS = 1.75nm) and dimeter average (108.96nm). The optical properties were characterized by (UV- Visible) and showed that higher transmittance about (97%) and optical Energy gab (Eg=3.28 eV).
Downloads
Published
How to Cite
Issue
Section
License
Copyright (c) 2023 Tikrit Journal of Pure Science
This work is licensed under a Creative Commons Attribution 4.0 International License.
Tikrit Journal of Pure Science is licensed under the Creative Commons Attribution 4.0 International License, which allows users to copy, create extracts, abstracts, and new works from the article, alter and revise the article, and make commercial use of the article (including reuse and/or resale of the article by commercial entities), provided the user gives appropriate credit (with a link to the formal publication through the relevant DOI), provides a link to the license, indicates if changes were made, and the licensor is not represented as endorsing the use made of the work. The authors hold the copyright for their published work on the Tikrit J. Pure Sci. website, while Tikrit J. Pure Sci. is responsible for appreciate citation of their work, which is released under CC-BY-4.0, enabling the unrestricted use, distribution, and reproduction of an article in any medium, provided that the original work is properly cited.