Preparation CdSe thin films by vacuum thermal evaporation and studying the effect of annealing time on structural, electrical and optical properties.

  • Kawkab D. Salim
  • Hanan Ridha

Abstract

CdSe thin films were deposited on a glass substrate by using vacuum thermal evaporation technique. The deposited films were annealed to 350˚C for (10, 20, 30) minutes respectively. Structural, morphological, optical and electrical properties of the films were studied by using X-ray diffraction (XRD), ultraviolet-visible (UV-Vis) spectroscopy; and Atomic force microscope (AFM). The X-ray diffraction pattern showed that the film has a cubic phase with preferred orientation (111), the grain size was found to be in the range of( 31-46)nm. The UV tests explain that the energy bandgap decrease with increasing of annealing time from 2.43eV to 2.17eV after 20minute annealed


 


http://dx.doi.org/10.25130/tjps.26.2021.032

Published
Apr 21, 2021
How to Cite
D. SALIM, Kawkab; RIDHA, Hanan. Preparation CdSe thin films by vacuum thermal evaporation and studying the effect of annealing time on structural, electrical and optical properties.. Tikrit Journal of Pure Science, [S.l.], v. 26, n. 2, p. 88-93, apr. 2021. ISSN 2415-1726. Available at: <http://tjps.tu.edu.iq/index.php/j/article/view/1128>. Date accessed: 08 dec. 2021. doi: http://dx.doi.org/10.25130/j.v26i2.1128.
Section
Articles